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International MEMS experts swapped ideas on reliability and test17.09.2010 - (idw) IVAM Fachverband für Mikrotechnik
A workshop organized by MEMUNITY took place on September 15, 2010 in Dortmund. More than 50 participants from 7 nations exchanged ideas on the new methods of wafer-level-testing and related topics.
The 14 presentations combined new scientific studies on the MEMS qualification process at IMEC, integration challenges of the RF-MEMS, wafer-level-testing in controlled vacuum and evaluation for manufacturing. The inviting partners Cascade Microtech from Dresden, Polytec from Waldbronn, IMMS from Ilmenau and Fraunhofer ENAS from Chemnitz expressed themselves as well pleased with the meeting.
The forum was organized by the MEMUNITY, an open network of enterprises and institutes that are principally committed to the subject of reliability and test. IVAM Microtechnology Network hosted the meeting in Dortmund.
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